X射线晶体分析仪用于研究物质内部微观结构，如：单晶定向，检测缺陷，物质定性，测定点阵参数，测定残余应力等
F-2000 Model X-ray crystal analysis meter is used for inspect the inner micro structure unkown,for example: single crystal direction,inspecting flaw defects,fix the nature,measure the lattice parameters,measure the remainder stress and others.